尊敬的业内同仁，您好！

泰微科技（珠海）有限公司诚挚地邀请您参加11月6日-8日在中国深圳·深圳坪山格兰云天国际酒店举办的第五届亚太碳化硅及相关材料国际会议。

在会议期间，泰微科技（珠海）有限公司将在NO.109展台上展出最新产品和技术，我们诚挚地邀请您莅临展台，与我们进行深入的交流和探讨，共同探索合作与发展的可能性。

Distinguished delegates，

Test-way Technology (Zhuhai) Co.,Ltd. sincerely invite you to participate in the 5th Asia-Pacific Conference on Silicon Carbide and Related Materials (APCSCRM 2024)！

APCSCRM 2024 will be grandly held in Grand Skylight International Hotel Shenzhen Pingshan, China, on November 06-08, 2024, for better accelerating the academic research, technological progress and industrial upgrading of silicon carbide and other wide bandgap semiconductor industries in the Asia-Pacific region.

During the conference, Test-way Technology (Zhuhai) Co.,Ltd. will exhibit the latest products and technologies on booth NO.109. We sincerely invite you to visit our booth for in-depth exchanges and discussions, and explore the possibilities of cooperation and development together.

企业简介/Company profile

泰微科技（珠海）有限公司成立于2022年10月，2023年6月完成天使轮融资。是一家专注于半导体检 测与自动化技术解决方案的公司，主要产品为晶圆缺陷检测和工艺量测设备。

泰微科技致力于半导体领域前后道纳米级缺陷检测、工艺量测设备研发、生产制造、销售及相关技术服务，旨在填补因国外设备商长期垄断下导致的国内半导体检测设备市场空白，实现半导体检测设备国 产化替代。泰微始终坚持以客户为导向，贴合客户实际功能需求，敏捷交付高精密半导体检测设备，帮 助客户发现和改善生产工艺，提高产品良品率和生产效率。

泰微科技前身孵化于上市公司博杰电子股份有限公司，博杰在工业自动化设备领域的深耕近20年， 以自动化测试和自动化组装设备研制开发为核心，形成了技术先进、可靠性高、质量稳定、应用领域广 泛、规格品种齐全的工业自动化设备与配件产品线，其中射频、ICT检测处于国内顶尖水平。泰微科技 沿袭博杰成熟的研发、生产、管理体系，为公司奠定基础。

Test-way technology (Zhuhai) Co. ltd. was founded in October 2022 and the angel round of financing was completed in June 2023. It is a company focusing on semiconductor inspection and automation technology solutions and its main products are wafer defect inspection and process measurement equipment.

Test-way Technology is dedicated to the research and development, production, sales, and related technical services of front-end and back-end nanoscale defect detection and process measurement equipment in the semiconductor field. It aims to fill the gap in the domestic semiconductor inspection equipment market caused by the long-term monopoly of foreign equipment manufacturers and realize the localization substitution of semiconductor inspection equipment. Test-way Technology has always adhered to the customer-oriented principle, met the actual functional needs of customers, and delivered high-precision semiconductor inspection equipment agilely to help customers discover and improve production processes, thereby enhancing product yield and production efficiency.

Test-way Technology is incubated by the listed company, Bojay Electronics Co., Ltd. with nearly 20 years of deep cultivation in the field of industrial automation equipment, Bojay focuses on the research and development of automated testing and automated assembly equipment, forming an advanced, reliable, stable, widely applied, and comprehensive range of industrial automation equipment and accessories. Among them, its radio frequency (RF) and In-Circuit Test (ICT) detection capabilities are top-notch in China. Test-way Technology inherits Bojay's mature research and development, production, and management systems, laying a solid foundation for the company.

产品简介/About Production

一、晶圆位错检测设备

Dislocation test equipment

针对晶圆表面按要求进行多点检测，可快速准确地识别位错信息

● 兼容产品尺寸 ：2~8英寸；

● 支持 面阵/线扫 两种功能；

● 适用于多种化合物半导体晶圆 ：SiC、InP、GaAS、GaSb、GaN等

●客户体系：珠海鼎泰，北京通美

It can perform multi-point inspection on the wafer surface as required, and can quickly and accurately identify dislocation

● Compatible wafer size: 2~8inch；

● Support aerial camera/ line-scan camera

● Suitable for various compound semiconductor wafers: SiC、InP、GaAS、GaSb、GaN etc.

●Customer System: Zhuhai Dingtai Xinyuan，Beijing Tongmei Xtal.

二、 晶圆缺陷检测设备

Defect test equipment

设备针对化合物半导体晶圆外延片及衬底表面因制造过程中的产生的缺陷检测

● 兼容产品尺寸 ：2~6英寸；

● 全自动检测有图形及无图形的表面缺陷；

● 适用于多种化合物半导体晶圆 ：SiC、InP、GaAS、GaSb、GaN等

●客户体系：焜原光电，全磊光电

Equipment for defect detection of compound semiconductor wafer epitaxial wafers and substrate surfaces caused during the manufacturing process

● Compatible wafer size: 2~6inch；

● Automatic detection of graphic and non-graphic surface defects

● Suitable for various compound semiconductor wafers: SiC、InP、GaAS、GaSb、GaN etc.

● Customer System: Acken Optoelectronics , Quanlei Optoelectronics Co..

三、晶圆平整度检测设备

Flatness test equipment

设备用于生产加工领域的晶圆检测设备， 采用非接触式快速测量晶圆的厚度及平整度参数，并以直观数据+2D或3D图形方式呈现

● 兼容产品尺寸 ：2~8英寸，可扩展至12寸；

● 全自动快速检测晶圆几何参数：THK、TTV、LTV、SFQR、TIR、BOW、WARP、3pt-Bow、3pt-Warp等面型相关参数；

● 适用于多种化合物半导体晶圆 ：Si、SiC、InP、GaAs、GaN、GaP、LiNbO3等晶圆；

● 对标产品：Corning Tropel FM200

●客户体系：天科合达，晶瑞，东尼，格力

The equipment is used for wafer inspection in the production and processing field. It adopts non-contact rapid measurement to measure the thickness and flatness parameters of wafers, and presents them in the form of intuitive data + 2D or 3D graphics.

● Compatible wafer size: 2~8inch， Scalable to 12 inches ；

● Fully automatic rapid detection of wafer geometric parameters: THK、TTV、LTV、SFQR、TIR、BOW、WARP、3pt-Bow、3pt-Warp and other parameters；

● Suitable for various compound semiconductor wafers: SiC、InP、GaAs、GaN、GaP、LiNbO3、Si etc.；

● Benchmark product ：Corning Tropel FM200

● Customer System: TankeBlue，Jingrui，Tonytech，Gree

联系方式/Contact:

泰微科技（珠海）有限公司

Test-way Technology(Zhuhai)Co.,Ltd.

邮箱/Email：

yuanyu_wei@test-way.com

电话/Tel:

0756-6180852

地址/Address：

广东省珠海市香洲区福田路10号1栋3楼泰微科技

Test-way technology(Zhuhai)Co. Ltd. , 3rd Floor，Bulding 1, No. 10 Futian Road, Xiangzhou District, Zhuhai City, Guangdong Province

关于会议/About APCSCRM2024

一、会议名称/Conference：

“芯时代开放创新·芯机遇合作发展”--第五届亚太碳化硅及相关材料国际会议

Open·lnnovation·Collaborative· Development——the 5th Asia-Pacific Conference on Silicon Carbide and Related Materials (APCSCRM 2024)

二、时间地点/Date&Venue：

时间：2024年11月6日—11月8日

地点：中国·深圳，深圳坪山格兰云天国际酒店

Date: Nov.6th,2024--Nov.8th,2024

Venue: Grand Skylight International Hotel Shenzhen Pingshan & Yanzi Lake International Convention and Exhibition Center

Location: No.36 Ruifing Road, Pingshan District, Shenzhen, Guangdong, China

三、组织机构/Organization：

四、会议安排/Schedule

五、赞助单位/Sponsors：

六、会议官网/Website：

https://apcscrm2024.casconf.cn/

七、报名参会/Registration：

扫码立刻报名

Scan to Register

八、会务联系/Contact:

商务合作 Business Cooperation

陈老师 Ms. Chen：86-13155757628

E-mail：lianmeng@iawbs.com

征文投稿 Submission

侯老师 Mr. Hou：86-13811837211

E-mail: mishuchu@iawbs.com

参会报名 Participant Registration

周老师 Ms. Zhou：86-17854177403

刘老师 Ms. Liu：86-18931699592

E-mail: apcscrm@iawbs.com