<?xml version="1.0" encoding="gbk"?>
<rss version="2.0">
  <channel>
    <title>中关村天合宽禁带半导体技术创新联盟 - 资源下载</title>
    <link>http://iawbs.com/forum.php?mod=forumdisplay&amp;fid=2</link>
    <description>Latest 20 threads of 资源下载</description>
    <copyright>Copyright(C) 中关村天合宽禁带半导体技术创新联盟</copyright>
    <generator>Discuz! Board by Comsenz Inc.</generator>
    <lastBuildDate>Tue, 21 Apr 2026 15:51:30 +0000</lastBuildDate>
    <ttl>60</ttl>
    <image>
      <url>http://iawbs.com/static/image/common/logo_88_31.gif</url>
      <title>中关村天合宽禁带半导体技术创新联盟</title>
      <link>http://iawbs.com/</link>
    </image>
    <item>
      <title>15-T_IAWBS 022-2024《SiC MOSFET阈值电压测试方法——电流源单点测试法》</title>
      <link>http://iawbs.com/forum.php?mod=viewthread&amp;tid=425640</link>
      <description><![CDATA[]]></description>
      <category>资源下载</category>
      <author>iawbs</author>
      <pubDate>Fri, 27 Dec 2024 08:20:24 +0000</pubDate>
    </item>
    <item>
      <title>T_IAWBS&#160;021-2024&#160;《碳化硅晶片边缘轮廓检验方法》</title>
      <link>http://iawbs.com/forum.php?mod=viewthread&amp;tid=425639</link>
      <description><![CDATA[]]></description>
      <category>资源下载</category>
      <author>iawbs</author>
      <pubDate>Fri, 27 Dec 2024 08:11:02 +0000</pubDate>
    </item>
    <item>
      <title>T/IAWBS 020—2024 碳化硅外延层深能级缺陷的测试 瞬态电容法</title>
      <link>http://iawbs.com/forum.php?mod=viewthread&amp;tid=425638</link>
      <description><![CDATA[]]></description>
      <category>资源下载</category>
      <author>iawbs</author>
      <pubDate>Fri, 01 Mar 2024 01:01:19 +0000</pubDate>
    </item>
    <item>
      <title>团体标准--T_IAWBS 006-2022 代替 T IAWBS 006-2018）碳化硅混合模块产品测试方法</title>
      <link>http://iawbs.com/forum.php?mod=viewthread&amp;tid=425637</link>
      <description><![CDATA[]]></description>
      <category>资源下载</category>
      <author>iawbs</author>
      <pubDate>Wed, 17 Jan 2024 08:44:54 +0000</pubDate>
    </item>
    <item>
      <title>T_IAWBS 005-2024（代替T_IAWBS 005-2018）  6~8英寸碳化硅单晶抛光片</title>
      <link>http://iawbs.com/forum.php?mod=viewthread&amp;tid=425636</link>
      <description><![CDATA[]]></description>
      <category>资源下载</category>
      <author>iawbs</author>
      <pubDate>Wed, 17 Jan 2024 02:16:42 +0000</pubDate>
    </item>
    <item>
      <title>T_IAWBS 019—2023半导体设备前端模块</title>
      <link>http://iawbs.com/forum.php?mod=viewthread&amp;tid=425635</link>
      <description><![CDATA[]]></description>
      <category>资源下载</category>
      <author>iawbs</author>
      <pubDate>Wed, 17 Jan 2024 02:14:00 +0000</pubDate>
    </item>
    <item>
      <title>团体标准--T_IAWBS 018-2022  金刚石单晶抛光片位错密度的测试方法</title>
      <link>http://iawbs.com/forum.php?mod=viewthread&amp;tid=425634</link>
      <description><![CDATA[]]></description>
      <category>资源下载</category>
      <author>iawbs</author>
      <pubDate>Wed, 17 Jan 2024 02:13:11 +0000</pubDate>
    </item>
    <item>
      <title>团体标准--T_IAWBS 017-2022 金刚石单晶片X射线双晶摇摆曲线半高宽测试方法</title>
      <link>http://iawbs.com/forum.php?mod=viewthread&amp;tid=425633</link>
      <description><![CDATA[]]></description>
      <category>资源下载</category>
      <author>iawbs</author>
      <pubDate>Wed, 17 Jan 2024 02:09:46 +0000</pubDate>
    </item>
    <item>
      <title>团体标准--T_IAWBS 016-2022 碳化硅单晶片X射线双晶摇摆曲线半高宽测试方法</title>
      <link>http://iawbs.com/forum.php?mod=viewthread&amp;tid=425632</link>
      <description><![CDATA[]]></description>
      <category>资源下载</category>
      <author>iawbs</author>
      <pubDate>Wed, 17 Jan 2024 02:01:38 +0000</pubDate>
    </item>
    <item>
      <title>团体标准--T_IAWBS 015-2021 氧化镓单晶片X射线双晶摇摆曲线半高宽测试方法</title>
      <link>http://iawbs.com/forum.php?mod=viewthread&amp;tid=425631</link>
      <description><![CDATA[]]></description>
      <category>资源下载</category>
      <author>iawbs</author>
      <pubDate>Wed, 17 Jan 2024 02:00:44 +0000</pubDate>
    </item>
    <item>
      <title>团体标准--T_IAWBS 0014-2021  碳化硅单晶抛光片位错密度的测试方法</title>
      <link>http://iawbs.com/forum.php?mod=viewthread&amp;tid=425630</link>
      <description><![CDATA[]]></description>
      <category>资源下载</category>
      <author>iawbs</author>
      <pubDate>Wed, 17 Jan 2024 01:54:09 +0000</pubDate>
    </item>
    <item>
      <title>碳化硅半导体产业发展白皮书2021</title>
      <link>http://iawbs.com/forum.php?mod=viewthread&amp;tid=425629</link>
      <description><![CDATA[]]></description>
      <category>资源下载</category>
      <author>iawbs</author>
      <pubDate>Wed, 06 Jul 2022 07:55:01 +0000</pubDate>
    </item>
    <item>
      <title>第三代半导体产业发展白皮书</title>
      <link>http://iawbs.com/forum.php?mod=viewthread&amp;tid=425628</link>
      <description><![CDATA[]]></description>
      <category>资源下载</category>
      <author>iawbs</author>
      <pubDate>Wed, 08 Dec 2021 08:03:09 +0000</pubDate>
    </item>
    <item>
      <title>团体标准--T_IAWBS 013-2019 半绝缘碳化硅单晶片电阻率非接触测量方法</title>
      <link>http://iawbs.com/forum.php?mod=viewthread&amp;tid=425627</link>
      <description><![CDATA[]]></description>
      <category>资源下载</category>
      <author>iawbs</author>
      <pubDate>Mon, 03 Feb 2020 07:49:09 +0000</pubDate>
    </item>
    <item>
      <title>团体标准--T_IAWBS 012-2019 碳化硅单晶抛光片表面质量和微管密度测试方法-共焦点干涉</title>
      <link>http://iawbs.com/forum.php?mod=viewthread&amp;tid=425626</link>
      <description><![CDATA[]]></description>
      <category>资源下载</category>
      <author>iawbs</author>
      <pubDate>Mon, 03 Feb 2020 07:46:26 +0000</pubDate>
    </item>
    <item>
      <title>团体标准--T_IAWBS 011-2019 导电碳化硅单晶片电阻率测量方法-非接触涡流法</title>
      <link>http://iawbs.com/forum.php?mod=viewthread&amp;tid=425625</link>
      <description><![CDATA[]]></description>
      <category>资源下载</category>
      <author>iawbs</author>
      <pubDate>Mon, 03 Feb 2020 07:44:37 +0000</pubDate>
    </item>
    <item>
      <title>团体标准--T_IAWBS 010-2019 碳化硅单晶抛光片表面质量和微管密度检测方法-激光散射法</title>
      <link>http://iawbs.com/forum.php?mod=viewthread&amp;tid=425624</link>
      <description><![CDATA[]]></description>
      <category>资源下载</category>
      <author>iawbs</author>
      <pubDate>Mon, 03 Feb 2020 07:43:36 +0000</pubDate>
    </item>
    <item>
      <title>团体标准--TIAWBS 009-2019 功率半导体器件稳态湿热高压偏置试验</title>
      <link>http://iawbs.com/forum.php?mod=viewthread&amp;tid=425623</link>
      <description><![CDATA[]]></description>
      <category>资源下载</category>
      <author>iawbs</author>
      <pubDate>Mon, 03 Feb 2020 07:41:16 +0000</pubDate>
    </item>
    <item>
      <title>团体标准--T/IAWBS 008-2019 SiC晶片的残余应力检测方法</title>
      <link>http://iawbs.com/forum.php?mod=viewthread&amp;tid=425622</link>
      <description><![CDATA[]]></description>
      <category>资源下载</category>
      <author>iawbs</author>
      <pubDate>Mon, 03 Feb 2020 07:38:19 +0000</pubDate>
    </item>
    <item>
      <title>团体标准--T/IAWBS 007-2018 4H碳化硅同质外延层厚度的红外反射测量方法</title>
      <link>http://iawbs.com/forum.php?mod=viewthread&amp;tid=425621</link>
      <description><![CDATA[]]></description>
      <category>资源下载</category>
      <author>iawbs</author>
      <pubDate>Mon, 03 Feb 2020 07:35:52 +0000</pubDate>
    </item>
  </channel>
</rss>